Failure Analysis

High Technology Devices

Daniel J. D. Sullivan, Eric J. Carleton

$151.95 $121.60

Paperback

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English

De Gruyter
24 October 2022

Analytical chemistry; Industrial chemistry; Chemical engineering; Materials science; Electronics engineering

Series: De Gruyter STEM

The book presents a unique view of failure analysis of high technology devices. It describes capabilities and limitations of many analytical techniques and testing paths and decisions best followed in example failure analysis studies.

By: Daniel J. D. Sullivan, Eric J. Carleton
Imprint: De Gruyter
Country of Publication: United States
Dimensions: Height: 240mm, Width: 170mm,
Weight: 238g
ISBN: 9781501524783
ISBN 10: 150152478X
Series: De Gruyter STEM
Pages: 128
Publication Date: 24 October 2022
Audience: Professional and scholarly , Undergraduate , Undergraduate
Format: Paperback
Publisher's Status: Active

Dr. Daniel J. D. Sullivan attended Cal & U. C. San Diego. Managed: FA, Reliability and Materials labs. Currently in sales and marketing at EAG labs. He has also written a non-technical book, “Don’t Date Crazy” by DJDS, and published a board game called Infection. Dr. Eric J. Carleton is a technology developer and consultant who has incubated multiple technology startups, founded Arrhenius, a failure analysis firm, and serves clients in a wide array of industries on scientific analysis and litigation matters.