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Aberration-Corrected Analytical Transmission Electron Microscopy

Rik Brydson (University Of Leeds)

$111.95

Hardback

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English
John Wiley & Sons Inc
23 September 2011
The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS).
Edited by:  
Imprint:   John Wiley & Sons Inc
Country of Publication:   United States
Dimensions:   Height: 236mm,  Width: 160mm,  Spine: 20mm
Weight:   581g
ISBN:   9780470518519
ISBN 10:   0470518510
Series:   RMS - Royal Microscopical Society
Pages:   304
Publication Date:  
Audience:   Professional and scholarly ,  Undergraduate
Format:   Hardback
Publisher's Status:   Active

Professor R.M.D. (Rik) Brydson is based in the School of Process, Environmental and Materials Engineering at the University of Leeds, UK. He is a committee member for the European Microscopy Society as well as the Electron Microscopy and Analysis Group (Institute of Physics).

Reviews for Aberration-Corrected Analytical Transmission Electron Microscopy

This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS). (Imaging & Microscopy, 1 March 2012)


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