testability are all crucial elements of VLSI circuit design. In this volume culled from the popular VLSI Handbook, experts from around the world provide in-depth discussions on these and related topics. Stacked gate, embedded, and flash memory all receive detailed treatment, including their power consumption and recent developments in low-power memories. Reflecting the rapid development and importance of systems-on-a-chip (SOCs), an entire chapter is devoted to application-specific integrated circuits (ASICs). Design-related topics include microprocessor architectures, layout methods, design verification, testability concepts, and various CAD tools..
Edited by:
Wai-Kai Chen (University of IIlinois Chicago USA) Imprint: CRC Press Inc Country of Publication: United States Dimensions:
Height: 254mm,
Width: 178mm,
Spine: 26mm
Weight: 1.830kg ISBN:9780849317378 ISBN 10: 0849317371 Series:Principles and Applications in Engineering Pages: 384 Publication Date:26 March 2003 Audience:
Professional and scholarly
,
Professional and scholarly
,
Professional & Vocational
,
Undergraduate
,
Further / Higher Education
Format:Hardback Publisher's Status: Active