Atomic Force Microscopy

Understanding Basic Modes and Advanced Applications

Greg Haugstad

$281.95

Hardback

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English

John Wiley & Sons Inc
07 September 2012

Microscopy; Nanotechnology; Mechanical engineering & materials

This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical origin of artifacts, and signal/noise limitations. Coverage spans imaging, materials property characterization, in-liquid interfacial analysis, tribology, and electromagnetic interactions.

“Supplementary material for this book can be found by entering ISBN 9780470638828 on booksupport.wiley.com”

By: Greg Haugstad
Imprint: John Wiley & Sons Inc
Country of Publication: United States
Dimensions: Height: 244mm, Width: 163mm, Spine: 31mm
Weight: 794g
ISBN: 9780470638828
ISBN 10: 0470638826
Pages: 496
Publication Date: 07 September 2012
Audience: Professional and scholarly , Undergraduate
Format: Hardback
Publisher's Status: Active

GREG HAUGSTAD, PhD, is a technical staff member and Director of the Characterization Facility in the College of Science and Engineering at the University of Minnesota. He has collaborated with industry professionals on such technologies as medical X-ray imaging media, lubrication, inkjet printing, and more recently on biomedical device coatings. He teaches undergraduate and graduate AFM courses, as well as short professional courses, and has trained over 600 AFM users.