Speckle Metrology

R.S. Sirohi, Brian J. Thompson (University of Rochester, New York, USA)

$788

Hardback

Not in-store but you can order this
How long will it take?

Availability Information

We source books from suppliers in Australia and overseas. For books we don't currently have in stock, the time it takes to get them from our suppliers can vary widely - from a few days to a few months - so we check each book with each supplier to determine the expected time it will take to be supplied to us.

We then advise you accordingly. If the time taken to get any book is too long for you, you can let us know and we will cancel or adjust your order, and refund as required.

To find out the anticipated arrival time for specific items prior to ordering, please contact us by phone or email:

Phone +61 2 9264 3111, or 1800 4 BOOKS (1800 4 26657) if outside Sydney:
option 1 Abbey's Bookshop (Crime, History, Science, Kids & more) • info@abbeys.com.au
option 2 Language Book Centre (ESL & Foreign Languages) • language@abbeys.com.au
option 3 Galaxy Bookshop (Sci-fi, Fantasy, Romance, Graphic Novels) • sf@galaxybooks.com.au

QTY:

English

CRC Press Inc
20 May 1993

Light (optics); Engineering measurement & calibration; Applied optics

Series: Optical Science and Engineering

This practical reference offers state-of-the-art coverage of speckle metrology and its value as a measuring technique in industry. Examing every important aspect of the field, ""Speckle Metrology"": surveys the origin of speckle displacement and decorrelation; presents procedures for deformation analysis and shape measurement of rough objects; explains particle image velocimetry (PIV), the processing of PIV records, and the design requirements of PIV equipment; discusses the applications of white light speckle methods and the production of artificial speckles; describes the measurement of surface roughness with laser speckles and polychromatic speckles; illustrates semiautomatic and automatic methods for the analysis of Young's fringes; calculates the variation of Young's fringes with the change in the microrelief of the rough surface; and explicates hololenses for imaging and provides design details with aberration corrections for hololense systems. With over 1500 literature citations, tables, figures and display equations, ""Speckle Metrology"" is a resource for students and professionals in the fields of optical, mechanical, electrical and electronics engineering; applied physics; and stress analysis.

By: R.S. Sirohi
Series edited by: Brian J. Thompson (University of Rochester New York USA)
Imprint: CRC Press Inc
Country of Publication: United States
Volume: 38
Dimensions: Height: 229mm, Width: 152mm, Spine: 31mm
Weight: 861g
ISBN: 9780824789329
ISBN 10: 0824789326
Series: Optical Science and Engineering
Pages: 572
Publication Date: 20 May 1993
Audience: Professional and scholarly , General/trade , Undergraduate
Format: Hardback
Publisher's Status: Active

Theory and applications of speckle displacement and decorrelation, I. Yamaguchi; techniques of displacement and deformation measurements in speckle metrology, Pramod K. Rastogi; speckle methods in experimental mechanics, Rajpal S. Sirohi; recent developments in video speckle interferometry, Ole J. Lokberg; novel applications of speckle metrology, Chandra S. Vikram; particle image velocimetry (PIV), K.D. Hinsch; white light speckle metrology, Anand K. Asundi; surface roughness evaluation, J.D. Briers; automatic fringe analysis procedures in speckle metrology, G.H. Kaufmann; speckle metrology using hololenses, Chandra Shahker; correlation speckle interferometry in the mechanics of contact interaction, Yu I. Ostrovsky and V.P. Shchepinov.

R. S Sirohi (Author)

Reviews for Speckle Metrology

"". . .an important addition to this field. "" ---Optics & Photonics News "". . .a good book. . ..covers most of the important aspects of speckle metrology. "" ---Optical Engineering