This textbook presents all the mathematical and physical concepts needed to visualize and understand representation surfaces, providing readers with a reliable and intuitive understanding of the behavior and properties of anisotropic materials, and a sound grasp of the directionality of material properties. They will learn how to extract quantitative information from representation surfaces, which encode tremendous amounts of information in a very concise way, making them especially useful in understanding higher order tensorial material properties (piezoelectric moduli, elastic compliance and rigidity, etc.) and in the design of applications based on these materials. Readers will also learn from scratch concepts on crystallography, symmetry and Cartesian tensors, which are essential for understanding anisotropic materials, their design and application. The book describes how to apply representation surfaces to a diverse range of material properties, making it a valuable resource for material scientists, mechanical engineers, and solid state physicists, as well as advanced undergraduates in Materials Science, Solid State Physics, Electronics, Optics, Mechanical Engineering, Composites and Polymer Science. Moreover, the book includes a wealth of worked-out examples, problems and exercises to help further understanding.
By:
Manuel Laso, Nieves Jimeno Imprint: Springer Nature Switzerland AG Country of Publication: Switzerland Edition: 1st ed. 2020 Dimensions:
Height: 235mm,
Width: 155mm,
Weight: 480g ISBN:9783030408725 ISBN 10: 3030408728 Series:Engineering Materials Pages: 297 Publication Date:05 April 2021 Audience:
Professional and scholarly
,
Undergraduate
Format:Paperback Publisher's Status: Active
Introduction.- Geometric symmetry.- Material Properties as Cartesian Tensors.- Representation surfaces.- Scalar and rank one properties.- Symmetric second rank properties.- Third rank properties.- Fourth rank properties.- Transversality and skew symmetric properties
Manuel Laso is full professor of Materials Science at the Institute of Optoelectronics and Microsystems of Technical University of Madrid (UPM), Spain.