Dahi Ghareab Abdelsalam Ibrahim received his BS and MS in physics from Minia University, Egypt, in 1997 and 2001, respectively. He holds a PhD in Optical Metrology, and is currently Professor of Optical Metrology in Engineering and Surface Metrology at the National Institute of Standards, Egypt. He has published more than 75 peer-reviewed papers, three book chapters, one patent, and one book titled ""Optical Metrology with Interferometry"".