Nanometrology Using the Transmission Electron Microscope

Vlad Stolojan

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English

Morgan & Claypool Publishers
30 October 2015

Mensuration & systems of measurement; Scientific equipment, experiments & techniques; Engineering measurement & calibration

Series: IOP Concise Physics

The Transmission Electron Microscope (TEM) is the ultimate tool to see and measure structures on the nanoscale and to probe their elemental composition and electronic structure with sub-nanometer spatial resolution. Recent technological breakthroughs have revolutionized our understanding of materials via use of the TEM, and it promises to become a significant tool in understanding biological and biomolecular systems such as viruses and DNA molecules. This book is a practical guide for scientists who need to use the TEM as a tool to answer questions about physical and chemical phenomena on the nanoscale.

By: Vlad Stolojan
Imprint: Morgan & Claypool Publishers
Country of Publication: United States
Dimensions: Height: 254mm, Width: 178mm, Spine: 4mm
Weight: 333g
ISBN: 9781681740560
ISBN 10: 1681740567
Series: IOP Concise Physics
Pages: 68
Publication Date: 30 October 2015
Audience: General/trade , ELT Advanced
Format: Paperback
Publisher's Status: Active

Introduction The Transmission Electron Microscope Imaging Resolution Image Calibration Sample Orientation Modes of Imaging and Diffraction Spectroscopy Energy-dispersive X-ray Spectroscopy (EDX) Electron Energy Loss Spectroscopy (EELS)

Dr Vlad Stolojan is a Lecturer in Nanomaterials Characterisation, working in the Advanced Technology Institute as part of the Nano-Electronics Centre. He is a member of the Institute of Physics and a fellow of the Royal Microscopical Society. Dr Stolojan is an alumnus of University of East Anglia (BSc Physics, 1996) and of the University of Cambridge (PhD Physics, 2001: ""Nanochemistry of grain boundaries in iron""). He first joined the University of Surrey's School of Engineering in 2001 as an expert in electron microscopy and energy-loss spectroscopy, continuing as an RCUK Fellow with the University of Surrey's Electronic Engineering department, in Professor Ravi Silva's group. Dr Stolojan is an author of more than 80 peer-reviewed publications, a reviewer for a number of journals (Carbon, Applied Surface Science, Ultramicroscopy, etc) and a member of the Materials Engineering and Nanotechnology Panel of the National Council for Certification of University Degrees, Romania (CNATDCU).