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Peter S. Pershan is Frank B. Baird, Jr Professor of Science in the Physics Department and the School of Engineering and Applied Science at Harvard University. In the early 1980s he helped produce the first synchrotron x-ray reflectometer for the study of the horizontal liquid surface. He has since led the liquid surface field in exploration of such diverse liquid surfaces as superfluid helium, water and liquid metals. Mark L. Schlossman is a Professor in the Department of Physics at the University of Illinois, Chicago. He built an x-ray reflectometer at the NSLS that subsequently served as a prototype when he helped design the ChemMatCARS instrument featured in the book. His use of both reflectometers led to pioneering studies of the structure of liquid-liquid interfaces.
Advance praise: '... a real treasure trove for researchers of liquid surfaces and interfaces. Peter Pershan, a founding father and a prime motive in the field of synchrotron x-ray studies of liquid surfaces, and Mark Schlossman, a leading expert in the field, present an admirable combination of a comprehensive, in-depth, exposition of the experimental methods and their underlying theory and data analysis approaches, with a lucid discussion of selected results obtained using these methods. The book's first part is an invaluable guide for researchers wishing to enter the field. The second ... is a broad, insightful and inspiring panorama of the field's major achievements, which is a joy to read ... the selection ... reflects elegantly the authors' wisdom, breadth of view, and 30 years of experience ... this volume will find a place of honor on the bookshelves of all researchers ... worldwide.' Moshe Deutsch, Bar-Ilan University, Israel 'Anyone interested in learning about the physical properties of liquid surfaces will appreciate this comprehensive treatise that emphasizes synchrotron x-ray scattering methods. The book provides a rigorous approach to scattering theory as well as a practical guide on how to align instruments. Pershan and Schlossman present an excellent summary of our current understanding of the structure and thermal fluctuations observed at liquid interfaces with a wide range of examples extending from simple liquids to Langmuir monolayers. There is no doubt that this will become the standard for many years.' Ben Ocko, Brookhaven National Laboratory '... Peter Pershan and Mark Schlossman, who are pioneers in the development of the modern experimental tools for the study of liquid interfaces, have written a masterful account of the uses of x-ray reflection and scattering to study liquid interfaces, and of the interpretation of the findings for many such interfaces. Their incisive treatment of the experimental methodology and the analysis of data obtained make this book a 'must read' for all physicists and chemists interested in liquid interfacial phenomena. This book will serve several purposes: as an introduction to the field for graduate students, as a reference to the subtleties of interpretation of data for active users of synchrotron radiation for interface studies, and as a thought-provoking survey of the many subtle properties of liquid interfaces and the differences and similarities of those properties across classes of liquids and contact media.' Stuart A. Rice, University of Chicago
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