Introduction to Scanning Tunneling Microscopy

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C. Julian Chen (Department of Applied Physics and Applied Mathematics, Columbia University, New York)

Introduction to Scanning Tunneling Microscopy

C. Julian Chen (Department of Applied Physics and Applied Mathematics, Columbia University, New York)

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English

Oxford University Press
09 January 2016

Medical imaging; Microscopy; Condensed matter physics (liquid state & solid state physics); Crystallography; Nanotechnology

Series: Monographs on the Physics and Chemistry of Materials

The scanning tunneling microscope and the atomic force microscope, both capable of imaging and manipulating individual atoms, were crowned with the Nobel Prize in Physics in 1986, and are the cornerstones of nanotechnology today. The first edition of this book has nurtured numerous beginners and experts since 1993. The second edition is a thoroughly updated version of this 'bible' in the field.

The second edition includes a number of new developments in the field. Non-contact atomic-force microscopy has demonstrated true atomic resolution. It enables direct observation and mapping of individual chemical bonds. A new chapter about the underlying physics, atomic forces, is added. The chapter on atomic force microscopy is substantially expanded. Spin-polarized STM has enabled the observation of local magnetic phenomena down to atomic scale. A pedagogical presentation of the basic concepts is included. Inelastic scanning tunneling microscopy has shown the capability of studying vibrational modes of individual molecules. The underlying theory and new instrumentation are added. For biological research, to increase the speed of scanning to observe life phenomena in real time is a key. Advances in this direction are presented as well. The capability of STM to manipulate individual atoms is one of the cornerstones of nanotechnology. The theoretical basis and in particular the relation between tunneling and interaction energy are thoroughly presented, together with experimental facts.

By: C. Julian Chen (Department of Applied Physics and Applied Mathematics Columbia University New York)
Imprint: Oxford University Press
Country of Publication: United Kingdom
Edition: 2nd Revised edition
Volume: 64
Dimensions: Height: 230mm, Width: 158mm, Spine: 26mm
Weight: 714g
ISBN: 9780198754756
ISBN 10: 0198754752
Series: Monographs on the Physics and Chemistry of Materials
Pages: 488
Publication Date: 09 January 2016
Audience: College/higher education , A / AS level , Further / Higher Education
Format: Paperback
Publisher's Status: Active

1: Overview Part I PRINCIPLES 2: Tunneling Phenomena 3: Tunneling Matrix Elements 4: Atomic forces 5: Atomic Forces and Tunneling 6: Nanometer-Scale Imaging 7: Atomic-Scale Imaging 8: Nanomechanical Effects Part II INSTRUMENTATION 9: Piezoelectric Scanners 10: Vibration Isolation 11: Electronics and Control 12: Mechanical Design 13: Tip Treatment 14: Scanning Tunneling Spectroscopy 15: The Atomic Force Microscope 16: Illustrative Applications APPENDICES A: Green's Functions B: Spherical Modified Bessel Functions C: Surface symmetry D: Elementary elasticity theory

C. Julian Chen, Department of Applied Physics and Applied Mathematics, Columbia University, New York, USA.

Reviews for Introduction to Scanning Tunneling Microscopy

[A]n excellent book that can serve as a standard introduction for everyone that starts working with scanning probe microscopes, and a useful reference work for those more advanced in the field. ... For everyone working in this field, the book by C. Julian Chen remains an indispensable basis, as well as an essential prerequisite for understanding the more specialized books and reviews on scanning probe microscopy. * J. A. A. W. Elemans, Journal of Applied Crystrallography *