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Impact of Electron and Scanning Probe Microscopy on Materials Research by David G. Rickerby at Abbey's Bookshop,
Impact of Electron and Scanning Probe Microscopy on Materials Research
— —
David G. Rickerby Giovanni Valdrè

Impact of Electron and Scanning Probe Microscopy on Materials Research

David G. Rickerby,  Giovanni Valdrè,  Ugo Valdrè

$337.95   $270.15

Paperback

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English
Springer
30 September 1999
Non-destructive testing
Series: NATO Science Series E:
This volume presents a coherent synopsis of a rapidly evolving field. Subjects covered include diffraction contrast and defect analysis by conventional TEM lattice imaging, phase contrast and resolution limits in high resolution electron microscopy. Specialized electron diffraction techniques are also covered, as is the application of parallel electron energy loss spectroscopy and scanning transmission EM for subnanometer analysis. Materials analyzed include thin films, interfaces and non-conventional materials. WDS and EDS are treated, with an emphasis on o(pZ) techniques for the analysis of thin layers and surface films. Theoretical and practical aspects of ESEM are discussed in relation to applications in crystal growth, biomaterials and polymers. Developments in SPM are also described.
Edited by:   , ,
Imprint:   Springer
Edition:   Softcover reprint of the original 1st ed. 1999
Volume:   364
Dimensions:   Height: 240mm,  Width: 160mm,  Spine: 26mm
Weight:   1.580kg
ISBN:   9780792359401
ISBN 10:   0792359402
Series:   NATO Science Series E:
Pages:   489
Publication Date:  
Audience:   College/higher education ,  Professional and scholarly ,  Further / Higher Education ,  Undergraduate
Format:   Paperback
Publisher's Status:   Active

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