This volume presents a coherent synopsis of a rapidly evolving field. Subjects covered include diffraction contrast and defect analysis by conventional TEM lattice imaging, phase contrast and resolution limits in high resolution electron microscopy. Specialized electron diffraction techniques are also covered, as is the application of parallel electron energy loss spectroscopy and scanning transmission EM for subnanometer analysis. Materials analyzed include thin films, interfaces and non-conventional materials. WDS and EDS are treated, with an emphasis on o(pZ) techniques for the analysis of thin layers and surface films. Theoretical and practical aspects of ESEM are discussed in relation to applications in crystal growth, biomaterials and polymers. Developments in SPM are also described.
Edited by:
David G. Rickerby, Giovanni Valdrè, Ugo Valdrè Imprint: Springer Edition: Softcover reprint of the original 1st ed. 1999 Volume: 364 Dimensions:
Height: 240mm,
Width: 160mm,
Spine: 26mm
Weight: 1.580kg ISBN:9780792359401 ISBN 10: 0792359402 Series:NATO Science Series E: Pages: 489 Publication Date:30 September 1999 Audience:
College/higher education
,
Professional and scholarly
,
Further / Higher Education
,
Undergraduate
Format:Paperback Publisher's Status: Active
The impact of electron microscopy on materials research.- Microstructural design and tayloring of advanced materials.- Nanostructured materials.- Characterization of heterophase transformation interfaces by high-resolution transmission electron microscope techniques.- High resolution scanning electron microscopy observations of nano-ceramics.- Metal-ceramic interfaces studied with high resolution transmission electron microscopy.- Z-contrast scanning transmission electron microscopy.- Electron energy loss spectrometry in the electron microscope - Part 1: Introduction.- Electron energy loss spectrometry in the electron microscope - Part 2: EELS in the context of solid state spectroscopies.- Electron energy loss spectrometry in the electron microscope - Part 3: Interfaces and localised spectrometry.- EELS near edge structures. Application to intermetallic alloys and other materials.- Surface chemistiy and microstructure analysis of novel technological materials.- Convergent beam electron diffraction.- New developments in scanning probe microscopy.- Low-energy scanning electron microscope for nanolithography.- Application of low voltage Scanning Electron Microscopy and energy dispersive x-ray spectroscopy.- Environmental SEM and related applications. History of the environmental SEM and basic design concepts.- Environmental SEM and related applications. Gas interactions and gaseous amplification.- Environmental SEM and related applications. Applications.- ESEM image contrast and applications to wet organic materials.- Advanced electron and scanning probe microscopy on dental and medical materials research.- Correlative microscopy and probing in materials science.- Epilogue.