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English
Wiley-Blackwell
20 April 2023
Handbook of Software Fault Localization

A comprehensive analysis of fault localization techniques and strategies

In Handbook of Software Fault Localization: Foundations and Advances, distinguished computer scientists Prof. W. Eric Wong and Prof. T.H. Tse deliver a robust treatment of up-to-date techniques, tools, and essential issues in software fault localization. The authors offer collective discussions of fault localization strategies with an emphasis on the most important features of each approach.

The book also explores critical aspects of software fault localization, like multiple bugs, successful and failed test cases, coincidental correctness, faults introduced by missing code, the combination of several fault localization techniques, ties within fault localization rankings, concurrency bugs, spreadsheet fault localization, and theoretical studies on fault localization.

Readers will benefit from the authors’ straightforward discussions of how to apply cost-effective techniques to a variety of specific environments common in the real world. They will also enjoy the in-depth explorations of recent research directions on this topic.

Handbook of Software Fault Localization also includes:

A thorough introduction to the concepts of software testing and debugging, their importance, typical challenges, and the consequences of poor efforts

Comprehensive explorations of traditional fault localization techniques, including program logging, assertions, and breakpoints

Practical discussions of slicing-based, program spectrum-based, and statistics-based techniques

In-depth examinations of machine learning-, data mining-, and model-based techniques for software fault localization

Perfect for researchers, professors, and students studying and working in the field, Handbook of Software Fault Localization: Foundations and Advances is also an indispensable resource for software engineers, managers, and software project decision makers responsible for schedule and budget control.
Edited by:   , , ,
Imprint:   Wiley-Blackwell
Country of Publication:   United States
Weight:   916g
ISBN:   9781119291800
ISBN 10:   1119291801
Pages:   608
Publication Date:  
Audience:   Professional and scholarly ,  Undergraduate
Format:   Paperback
Publisher's Status:   Active
Editor Biographies xv List of Contributors xvii 1 Software Fault Localization: an Overview of Research, Techniques, and Tools 1 W. Eric Wong, Ruizhi Gao, Yihao Li, Rui Abreu, Franz Wotawa, and Dongcheng li 1.1 Introduction 1 1.2 Traditional Fault Localization Techniques 14 1.2.1 Program Logging 14 1.2.2 Assertions 14 1.2.3 Breakpoints 14 1.2.4 Profiling 15 1.3 Advanced Fault Localization Techniques 15 1.3.1 Slicing-Based Techniques 15 1.3.2 Program Spectrum-Based Techniques 20 1.3.2.1 Notation 20 1.3.2.2 Techniques 21 1.3.2.3 Issues and Concerns 27 1.3.3 Statistics-Based Techniques 30 1.3.4 Program State-Based Techniques 32 1.3.5 Machine Learning-Based Techniques 34 1.3.6 Data Mining-Based Techniques 36 1.3.7 Model-Based Techniques 37 1.3.8 Additional Techniques 41 1.3.9 Distribution of Papers in Our Repository 45 1.4 Subject Programs 47 1.5 Evaluation Metrics 50 1.6 Software Fault Localization Tools 53 1.7 Critical Aspects 58 1.7.1 Fault Localization with Multiple Bugs 58 1.7.2 Inputs, Outputs, and Impact of Test Cases 60 1.7.3 Coincidental Correctness 63 1.7.4 Faults Introduced by Missing Code 64 1.7.5 Combination of Multiple Fault Localization Techniques 65 1.7.6 Ties Within Fault Localization Rankings 67 1.7.7 Fault Localization for Concurrency Bugs 67 1.7.8 Spreadsheet Fault Localization 68 1.7.9 Theoretical Studies 70 1.8 Conclusion 71 Notes 73 References 73 2 Traditional Techniques for Software Fault Localization 119 Yihao Li, Linghuan Hu, W. Eric Wong, Vidroha Debroy, and Dongcheng li 2.1 Program Logging 119 2.2 Assertions 121 2.3 Breakpoints 124 2.4 Profiling 125 2.5 Discussion 128 2.6 Conclusion 130 References 131 3 Slicing-Based Techniques for Software Fault Localization 135 W. Eric Wong, Hira Agrawal, and Xiangyu Zhang 3.1 Introduction 135 3.2 Static Slicing-Based Fault Localization 136 3.2.1 Introduction 136 3.2.2 Program Slicing Combined with Equivalence Analysis 137 3.2.3 Further Application 138 3.3 Dynamic Slicing-Based Fault Localization 138 3.3.1 Dynamic Slicing and Backtracking Techniques 144 3.3.2 Dynamic Slicing and Model-Based Techniques 145 3.3.3 Critical Slicing 148 3.3.3.1 Relationships Between Critical Slices (CS) and Exact Dynamic Program Slices (DPS) 149 3.3.3.2 Relationship Between Critical Slices and Executed Static Program Slices 150 3.3.3.3 Construction Cost 150 3.3.4 Multiple-Points Dynamic Slicing 151 3.3.4.1 BwS of an Erroneous Computed Value 152 3.3.4.2 FwS of Failure-Inducing Input Difference 152 3.3.4.3 BiS of a Critical Predicate 154 3.3.4.4 MPSs: Dynamic Chops 157 3.3.5 Execution Indexing 158 3.3.5.1 Concepts 159 3.3.5.2 Structural Indexing 161 3.3.6 Dual Slicing to Locate Concurrency Bugs 165 3.3.6.1 Trace Comparison 165 3.3.6.2 Dual Slicing 168 3.3.7 Comparative Causality: a Causal Inference Model Based on Dual Slicing 173 3.3.7.1 Property One: Relevance 174 3.3.7.2 Property Two: Sufficiency 175 3.3.8 Implicit Dependences to Locate Execution Omission Errors 177 3.3.9 Other Dynamic Slicing-Based Techniques 179 3.4 Execution Slicing-Based Fault Localization 179 3.4.1 Fault Localization Using Execution Dice 179 3.4.2 A Family of Fault Localization Heuristics Based on Execution Slicing 181 3.4.2.1 Heuristic I 182 3.4.2.2 Heuristic II 183 3.4.2.3 Heuristic III 185 3.4.3 Effective Fault Localization Based on Execution Slices and Inter-block Data Dependence 188 3.4.3.1 Augmenting a Bad D(1) 189 3.4.3.2 Refining a Good D(1) 190 3.4.3.3 An Incremental Debugging Strategy 191 3.4.4 Other Execution Slicing-Based Techniques in Software Fault Localization 193 3.5 Discussions 193 3.6 Conclusion 194 Notes 195 References 195 4 Spectrum-Based Techniques for Software Fault Localization 201 W. Eric Wong, Hua Jie Lee, Ruizhi Gao, and Lee Naish 4.1 Introduction 201 4.2 Background and Notation 203 4.2.1 Similarity Coefficient-Based Fault Localization 204 4.2.2 An Example of Using Similarity Coefficient to Compute Suspiciousness 205 4.3 Insights of Some Spectra-Based Metrics 210 4.4 Equivalence Metrics 212 4.4.1 Applicability of the Equivalence Relation to Other Fault Localization Techniques 217 4.4.2 Applicability Beyond Fault Localization 218 4.5 Selecting a Good Suspiciousness Function (Metric) 219 4.5.1 Cost of Using a Metric 219 4.5.2 Optimality for Programs with a Single Bug 220 4.5.3 Optimality for Programs with Deterministic Bugs 221 4.6 Using Spectrum-Based Metrics for Fault Localization 222 4.6.1 Spectrum-Based Metrics for Fault Localization 222 4.6.2 Refinement of Spectra-Based Metrics 227 4.7 Empirical Evaluation Studies of SBFL Metrics 232 4.7.1 The Construction of D ∗ 234 4.7.2 An Illustrative Example 235 4.7.3 A Case Study Using D ∗ 237 4.7.3.1 Subject Programs 237 4.7.3.2 Fault Localization Techniques Used in Comparisons 238 4.7.3.3 Evaluation Metrics and Criteria 239 4.7.3.4 Statement with Same Suspiciousness Values 240 4.7.3.5 Results 241 4.7.3.6 Effectiveness of D ∗ with Different Values of ∗ 247 4.7.3.7 D ∗ Versus Other Fault Localization Techniques 248 4.7.3.8 Programs with Multiple Bugs 251 4.7.3.9 Discussion 255 4.8 Conclusion 261 Notes 262 References 263 5 Statistics-Based Techniques for Software Fault Localization 271 Zhenyu Zhang and W. Eric Wong 5.1 Introduction 271 5.1.1 Tarantula 272 5.1.2 How It Works 272 5.2 Working with Statements 274 5.2.1 Techniques Under the Same Problem Settings 275 5.2.2 Statistical Variances 275 5.3 Working with Non-statements 283 5.3.1 Predicate: a Popular Trend 283 5.3.2 BPEL: a Sample Application 285 5.4 Purifying the Input 286 5.4.1 Coincidental Correctness Issue 286 5.4.2 Class Balance Consideration 287 5.5 Reinterpreting the Output 288 5.5.1 Revealing Fault Number 288 5.5.2 Noise Reduction 291 Notes 292 References 293 6 Machine Learning-Based Techniques for Software Fault Localization 297 W. Eric Wong 6.1 Introduction 297 6.2 BP Neural Network-Based Fault Localization 298 6.2.1 Fault Localization with a BP Neural Network 298 6.2.2 Reduce the Number of Candidate Suspicious Statements 302 6.3 RBF Neural Network-Based Fault Localization 304 6.3.1 RBF Neural Networks 304 6.3.2 Methodology 305 6.3.2.1 Fault Localization Using an RBF Neural Network 306 6.3.2.2 Training of the RBF Neural Network 307 6.3.2.3 Definition of a Weighted Bit-Comparison-Based Dissimilarity 309 6.4 C4.5 Decision Tree-Based Fault Localization 309 6.4.1 Category-Partition for Rule Induction 309 6.4.2 Rule Induction Algorithms 310 6.4.3 Statement Ranking Strategies 310 6.4.3.1 Revisiting Tarantula 310 6.4.3.2 Ranking Statements Based on C4.5 Rules 312 6.5 Applying Simulated Annealing with Statement Pruning for an SBFL Formula 314 6.6 Conclusion 317 Notes 317 References 317 7 Data Mining-Based Techniques for Software Fault Localization 321 Peggy Cellier, Mireille Ducassé, Sébastien Ferré, Olivier Ridoux, and W. Eric Wong 7.1 Introduction 321 7.2 Formal Concept Analysis and Association Rules 324 7.2.1 Formal Concept Analysis 325 7.2.2 Association Rules 327 7.3 Data Mining for Fault Localization 329 7.3.1 Failure Rules 329 7.3.2 Failure Lattice 331 7.4 The Failure Lattice for Multiple Faults 336 7.4.1 Dependencies Between Faults 336 7.4.2 Example 341 7.5 Discussion 342 7.5.1 The Structure of the Execution Traces 342 7.5.2 Union Model 343 7.5.3 Intersection Model 343 7.5.4 Nearest Neighbor 343 7.5.5 Delta Debugging 344 7.5.6 From the Trace Context to the Failure Context 344 7.5.7 The Structure of Association Rules 345 7.5.8 Multiple Faults 345 7.6 Fault Localization Using N-gram Analysis 346 7.6.1 Background 347 7.6.1.1 Execution Sequence 347 7.6.1.2 N-gram Analysis 347 7.6.1.3 Linear Execution Blocks 349 7.6.1.4 Association Rule Mining 349 7.6.2 Methodology 350 7.6.3 Conclusion 353 7.7 Fault Localization for GUI Software Using N-gram Analysis 353 7.7.1 Background 354 7.7.1.1 Representation of the GUI and Its Operations 354 7.7.1.2 Event Handler 356 7.7.1.3 N-gram 356 7.7.2 Association Rule Mining 357 7.7.3 Methodology 357 7.7.3.1 General Approach 358 7.7.3.2 N-gram Fault Localization Algorithm 358 7.8 Conclusion 360 Notes 361 References 361 8 Information Retrieval-Based Techniques for Software Fault Localization 365 Xin Xia and David Lo 8.1 Introduction 365 8.2 General IR-Based Fault Localization Process 368 8.3 Fundamental Information Retrieval Techniques for Software Fault Localization 369 8.3.1 Vector Space Model 369 8.3.2 Topic Modeling 370 8.3.3 Word Embedding 371 8.4 Evaluation Metrics 372 8.4.1 Top-k Prediction Accuracy 372 8.4.2 Mean Reciprocal Rank (MRR) 373 8.4.3 Mean Average Precision (MAP) 373 8.5 Techniques for Different Scenarios 374 8.5.1 Text of Current Bug Report Only 374 8.5.1.1 VSM Variants 374 8.5.1.2 Topic Modeling 375 8.5.2 Text and History 376 8.5.2.1 VSM Variants 376 8.5.2.2 Topic Modeling 378 8.5.2.3 Deep Learning 378 8.5.3 Text and Stack/Execution Traces 379 8.6 Empirical Studies 380 8.7 Miscellaneous 383 8.8 Conclusion 385 Notes 385 References 386 9 Model-Based Techniques for Software Fault Localization 393 Birgit Hofer, Franz Wotawa, Wolfgang Mayer, and Markus Stumptner 9.1 Introduction 393 9.2 Basic Definitions and Algorithms 395 9.2.1 Algorithms for MBD 401 9.3 Modeling for MBD 404 9.3.1 The Value-Based Model 405 9.3.2 The Dependency-Based Model 409 9.3.3 Approximation Models for Debugging 413 9.3.4 Other Modeling Approaches 416 9.4 Application Areas 417 9.5 Hybrid Approaches 418 9.6 Conclusions 419 Notes 420 References 420 10 Software Fault Localization in Spreadsheets 425 Birgit Hofer and Franz Wotawa 10.1 Motivation 425 10.2 Definition of the Spreadsheet Language 427 10.3 Cones 430 10.4 Spectrum-Based Fault Localization 431 10.5 Model-Based Spreadsheet Debugging 435 10.6 Repair Approaches 440 10.7 Checking Approaches 443 10.8 Testing 445 10.9 Conclusion 446 Notes 446 References 447 11 Theoretical Aspects of Software Fault Localization 451 Xiaoyuan Xie and W. Eric Wong 11.1 Introduction 451 11.2 A Model-Based Hybrid Analysis 452 11.2.1 The Model Program Segment 452 11.2.2 Important Findings 454 11.2.3 Discussion 454 11.3 A Set-Based Pure Theoretical Framework 455 11.3.1 Definitions and Theorems 455 11.3.2 Evaluation 457 11.3.3 The Maximality Among All Investigated Formulas 461 11.4 A Generalized Study 462 11.4.1 Spectral Coordinate for SBFL 462 11.4.2 Generalized Maximal and Greatest Formula in F 464 11.5 About the Assumptions 465 11.5.1 Omission Fault and 100% Coverage 465 11.5.2 Tie-Breaking Scheme 467 11.5.3 Multiple Faults 467 11.5.4 Some Plausible Causes for the Inconsistence Between Empirical and Theoretical Analyses 468 Notes 469 References 470 12 Software Fault Localization for Programs with Multiple Bugs 473 Ruizhi Gao, W. Eric Wong, and Rui Abreu 12.1 Introduction 473 12.2 One-Bug-at-a-Time 474 12.3 Two Techniques Proposed by Jones et al. 475 12.3.1 J1: Clustering Based on Profiles and Fault Localization Results 476 12.3.1.1 Clustering Profile-Based Behavior Models 476 12.3.1.2 Using Fault Localization to Stop Clustering 478 12.3.1.3 Using Fault Localization Clustering to Refine Clusters 479 12.3.2 J2: Clustering Based on Fault Localization Results 480 12.4 Localization of Multiple Bugs Using Algorithms from Integer Linear Programming 481 12.5 MSeer: an Advanced Fault Localization Technique for Locating Multiple Bugs in Parallel 483 12.5.1 MSeer 485 12.5.1.1 Representation of Failed Test Cases 485 12.5.1.2 Revised Kendall tau Distance 486 12.5.1.3 Clustering 488 12.5.1.4 MSeer: a Technique for Locating Multiple Bugs in Parallel 494 12.5.2 A Running Example 496 12.5.3 Case Studies 499 12.5.3.1 Subject Programs and Data Collections 499 12.5.3.2 Evaluation of Effectiveness and Efficiency 501 12.5.3.3 Results 503 12.5.4 Discussions 510 12.5.4.1 Using Different Fault Localization Techniques 510 12.5.4.2 Apply MSeer to Programs with a Single Bug 510 12.5.4.3 Distance Metrics 512 12.5.4.4 The Importance of Estimating the Number of Clusters and Assigning Initial Medoids 514 12.6 Spectrum-Based Reasoning for Fault Localization 514 12.6.1 Barinel 515 12.6.2 Results 517 12.7 Other Studies 518 12.8 Conclusion 520 Notes 521 References 522 13 Emerging Aspects of Software Fault Localization 529 T.H. Tse, David Lo, Alex Gorce, Michael Perscheid, Robert Hirschfeld, and W. Eric Wong 13.1 Introduction 529 13.2 Application of the Scientific Method to Fault Localization 530 13.2.1 Scientific Debugging 531 13.2.2 Identifying and Assigning Bug Reports to Developers 532 13.2.3 Using Debuggers in Fault Localization 534 13.2.4 Conclusion 538 13.3 Fault Localization in the Absence of Test Oracles by Semi-proving of Metamorphic Relations 538 13.3.1 Metamorphic Testing and Metamorphic Relations 539 13.3.2 The Semi-proving Methodology 541 13.3.2.1 Semi-proving by Symbolic Evaluation 541 13.3.2.2 Semi-proving as a Fault Localization Technique 542 13.3.3 The Need to Go Beyond Symbolic Evaluation 543 13.3.4 Initial Empirical Study 543 13.3.5 Detailed Illustrative Examples 544 13.3.5.1 Fault Localization Example Related to Predicate Statement 544 13.3.5.2 Fault Localization Example Related to Faulty Statement 548 13.3.5.3 Fault Localization Example Related to Missing Path 552 13.3.5.4 Fault Localization Example Related to Loop 556 13.3.6 Comparisons with Related Work 558 13.3.7 Conclusion 560 13.4 Automated Prediction of Fault Localization Effectiveness 560 13.4.1 Overview of PEFA 561 13.4.2 Model Learning 564 13.4.3 Effectiveness Prediction 564 13.4.4 Conclusion 564 13.5 Integrating Fault Localization into Automated Test Generation Tools 565 13.5.1 Localization in the Context of Automated Test Generation 566 13.5.2 Automated Test Generation Tools Supporting Localization 567 13.5.3 Antifragile Tests and Localization 568 13.5.4 Conclusion 568 Notes 569 References 569 Index 581

W. Eric Wong, PhD, is a Full Professor, Director of Software Engineering Program, and the Founding Director of Advanced Research Center for Software Testing and Quality Assurance in Computer Science at the University of Texas at Dallas. He is also a Guest Researcher with the US National Institute of Standards and Technology. Professor Wong was the award recipient of the 2014 IEEE Reliability Society Engineer of the Year. In addition, he was the Editor-in-Chief of the IEEE Transactions on Reliability from June 2016 to May 2022. He received his MS and PhD in Computer Science from Purdue University. T.H. Tse received his PhD from London School of Economics, and was a Visiting Fellow at University of Oxford. He is an Honorary Professor in Computer Science with The University of Hong Kong after retiring from full professorship. He is a Steering Committee Chair of the IEEE International Conference on Software Quality, Reliability, and Security; and an Associate Editor of IEEE Transactions on Reliability. He has over 270 publications, including a book with Cambridge University Press. He ranks internationally as no. 2 in metamorphic testing. He was awarded an MBE by Queen Elizabeth II of the United Kingdom.

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